The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Sep. 23, 2020
Sangmyung University Industry-academy Cooperation Foundation, Seoul, KR;
Hoon Yoo, Suwon-si, KR;
Abstract
Provided is a method of reconstructing an integral image based on computational integral imaging reconstruction (CIIR), the method including determining a crop ratio of an original elemental image array (EIA), cropping each elemental image in the original EIA according to the determined crop ratio to generate a cropped and translated EIA, magnifying each elemental image in the cropped and translated EIA according to an adjustable magnification factor (k), overlapping the magnified elemental images with an overlapping number that is adjusted according to the adjustable magnification factor (k), and normalizing the overlapping elemental images to generate a reconstructed image.