The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Nov. 03, 2021
Applicant:

Aon Benfield Inc., Chicago, IL (US);

Inventor:

Takeshi Okazaki, Tokyo, JP;

Assignee:

Aon Benfield Inc., Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 40/00 (2012.01); G06K 9/62 (2022.01); G06N 20/20 (2019.01); G06T 7/00 (2017.01); G06N 3/08 (2006.01); G06V 10/46 (2022.01); G06V 20/13 (2022.01);
U.S. Cl.
CPC ...
G06K 9/6268 (2013.01); G06N 3/08 (2013.01); G06N 20/20 (2019.01); G06T 7/0002 (2013.01); G06V 10/462 (2022.01); G06V 20/13 (2022.01);
Abstract

In one aspect, classifying features and feature conditions of a property represented in digital imagery includes training a characteristic classifier for applying multilayer artificial perception to classifying features represented in a property image into feature classifications, training a condition classifier for applying multilayer artificial perception to classifying a condition of each feature into one of a set of condition qualifiers, accessing digital image(s) of a property, and applying a machine learning analysis model including the characteristic classifier and the condition classifier to the digital image(s) to identify, for each feature represented in the image(s), a feature classification and a condition qualifier.


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