The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Sep. 17, 2019
Livermore Software Technology Corporation, Livermore, CA (US);
Katharina Witowski, Rutesheim, DE;
Nielen Stander, Pleasanton, CA (US);
Anirban Basudhar, Livermore, CA (US);
Other;
Abstract
A reference curve representing measured stress-strain data obtained in a material test of a specimen is received. FEA model is created to represent the specimen which is associated with numerical material properties defined by a formula having a set of adjustable coefficients. Multiple computed curves are obtained each defined with multiple nodes of computed stress-strain values by conducting a time-marching simulation of the material test using the FEA model with a set of unique coefficients. Respective curve difference measurement parameters are calculated between each computed curve and the reference curve using a similarity measure technique that includes trimming off excess end portion of each computed curve so as to match the reference curve. Optimal values of the adjustable coefficients are determined by estimating a minimum of the curve difference measurement parameters according to an optimization technique.