The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Sep. 25, 2017
Applicants:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Toshiba Digital Solutions Corporation, Kawasaki, JP;

Inventors:

Tetsuya Hayashi, Arakawa, JP;

Minoru Nishizawa, Itabashi, JP;

Kozo Banno, Yokohama, JP;

Yasuomi Une, Kawasaki, JP;

Shigeru Matsumoto, Nishitokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/906 (2019.01); G06F 16/904 (2019.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06F 16/906 (2019.01); G06F 16/904 (2019.01); G06K 9/6267 (2013.01);
Abstract

A state analysis device includes a data classification unit, an analysis unit, and a determination unit. The data classification unit is configured to classify input data for each of a plurality of verification items associated with each of a plurality of control items. The analysis unit is configured to execute analysis associated with each combination of a plurality of control items and a plurality of verification items on the basis of data classified by the data classification unit. The determination unit is configured to comprehensively determine analysis results in units of combinations of the control items and the verification items on the basis of analysis results analyzed by the analysis unit.


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