The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Nov. 01, 2019
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Jeffrey Wilson, Franklin, MA (US);

Michael Ferrari, Douglas, MA (US);

Shruti Gupta, Hopkinton, MA (US);

George F. Lettery, North Grafton, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0253 (2013.01); G06F 2212/1044 (2013.01);
Abstract

Snapshot metadata may include a plurality of pages of nodes, including active nodes and free nodes. It may be determined whether a snapshot metadata object is eligible for de-allocation, for example, of one or more of the pages of its snapshot metadata nodes. This determination may be based on a number of free nodes in the snapshot metadata object, for example, in relation to the quantity of nodes that are included in a snapshot metadata page. This determination may be made based on previous usage of the nodes allocated to the snapshot metadata object, for example, the number of active nodes relative to a total size of the snapshot metadata object. For example, a maximum extent of active nodes during one or more periods may be compared to a current extent of active nodes to determine whether the snapshot metadata object is eligible.


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