The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Jan. 17, 2018
Mitsubishi Electric Corporation, Tokyo, JP;
Madoka Baba, Tokyo, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
A test case generation apparatus () analyzes test target software that is software to execute the process of one step for each input of a value, thereby generating, as a test case, a sequence of values that are input for a test of the software. In that case, an equivalent step checking unit () determines that when the value of a state variable after execution of one of a plurality of steps that share the state variable and the value of the state variable after execution of a different step are equal with respect to the state variable, those two steps are equivalent steps. A test case generation unit () analyzes the test target software, excluding one of the two steps determined to be the equivalent step by the equivalent step checking unit (), thereby generating the value to be included in the test case.