The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Oct. 24, 2019
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Paulo Ferreira, Rio de Janeiro, BR;
Adriana Prado, Niterói, BR;
Pablo Da Silva, Niterói, BR;
Ron Arnan, Nes Ziona, IL;
Hagay Dagan, Pardes Hanna, IL;
Adnan Sahin, Needham, MA (US);
Dell Products L.P., Hopkinton, MA (US);
Abstract
Telemetry data gathered from active deployed SAN nodes is used to create a machine learning model that predicts storage system performance, e.g. in terms of response time. The telemetry data may be filtered to remove outlier values and less relevant information before creating the training dataset. Engineered features may be created that include types of data that are not present in the telemetry data. For example, data types from the telemetry data may be combined to create engineered features that are more relevant than the individual data types. The engineered features are included in the training dataset. The machine learning model may be used to test possible configurations for a planned SAN node based on expected workload and performance requirements. Outputted data may include satisfactory configurations for a planned storage system.