The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
May. 07, 2020
Applicant:
Hexagon Metrology, Inc., North Kingstown, RI (US);
Inventors:
Jonathan J. O'Hare, East Greenwich, RI (US);
Jonathan Dove, Woodstock, IL (US);
Joseph VanPelt, Charlotte, NC (US);
Assignee:
Hexagon Metrology, Inc., North Kingstown, RI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01); G06F 3/0481 (2022.01); G05B 19/406 (2006.01); G05B 19/4155 (2006.01); G06F 3/04817 (2022.01); G06F 3/0482 (2013.01); G05B 19/418 (2006.01); G01B 21/04 (2006.01); G01B 5/012 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0481 (2013.01); G01B 21/047 (2013.01); G05B 19/406 (2013.01); G05B 19/4155 (2013.01); G05B 19/4187 (2013.01); G06F 3/0482 (2013.01); G06F 3/04817 (2013.01); G01B 5/012 (2013.01); G05B 2219/32077 (2013.01); G05B 2219/32368 (2013.01); G05B 2219/50391 (2013.01);
Abstract
Various embodiments enable batch inspection of a plurality of workpieces by and inspection instrument such as a coordinate measuring machine. Some embodiments present user interfaces, including graphical user interfaces, to enable an operator to configure a batch inspection system and a batch inspection job, and to monitor and control execution of a batch inspection job.