The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Jun. 03, 2020
Applicant:

Zeon Corporation, Tokyo, JP;

Inventor:

Toshihide Murakami, Tokyo, JP;

Assignee:

ZEON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/30 (2006.01); B42D 25/364 (2014.01); B42D 25/328 (2014.01); G02B 5/32 (2006.01); G02B 5/18 (2006.01); C08G 61/08 (2006.01); C08J 5/18 (2006.01); G02F 1/13363 (2006.01);
U.S. Cl.
CPC ...
G02B 5/3083 (2013.01); B42D 25/328 (2014.10); B42D 25/364 (2014.10); C08G 61/08 (2013.01); C08J 5/18 (2013.01); G02B 5/18 (2013.01); G02B 5/30 (2013.01); G02B 5/32 (2013.01); G02F 1/133634 (2013.01); C08G 2261/3324 (2013.01); C08G 2261/418 (2013.01); C08J 2365/00 (2013.01); G02F 1/133638 (2021.01);
Abstract

Provided is a phase difference film formed of a resin containing a polymer having crystallizability, and having an NZ factor of less than 1. A production method of the phase different film includes: bonding a second film to one or both surfaces of a first film formed of a resin containing the polymer having crystallizability and having a glass transition temperature Tg (° C.) and a melting point Tm (° C.), to obtain a third film, the second film having a shrinkage percentage in at least one direction at (Tg+30)° C. of 5% or more and 50% or less; heating the third film to Tg° C. or higher and (Tg+3)° C. or lower to obtain a fourth film; and heating the fourth film to (Tg+50)° C. or higher and (Tm−40)° C. or lower.


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