The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Jan. 17, 2018
Applicant:
Nec Corporation, Tokyo, JP;
Inventor:
Shigeru Koumoto, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 19/25 (2006.01); G08C 15/06 (2006.01);
U.S. Cl.
CPC ...
G01R 19/2509 (2013.01); G08C 15/06 (2013.01);
Abstract
A measurement apparatus that measures a facility of a measurement target and that is able to transmit measurement data as intermittent data and an analysis apparatus. An analysis apparatus includes: a communication part that receives the intermittent data from the measurement apparatus; and an analysis part that estimates a standard data pattern serving as a reference, based on a common portion between a pair of the data in a set of the intermittent data received and determines presence of an anomaly for intermittent data of a determination target received from the measurement apparatus by referring to the standard data pattern.