The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Aug. 04, 2021
Applicant:

Nanometronix, Llc, Bloomington, MN (US);

Inventor:

Antanas Daugela, Bloomington, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/04 (2010.01);
U.S. Cl.
CPC ...
G01Q 30/04 (2013.01);
Abstract

A method of creating and characterizing a representative image of the surface of an object from acoustic emissions of a multimode ultrasonic probe tip and transducer integrated into a micro tool, such as a nano indenter or a nano indenter interfaced with a Scanning Probe Microscope (SPM). The representative image may be utilized to predict mechanical properties or characteristics of the sample, including topography, fracture patterns, indents and artifacts. The tip component is configured to operate at multi-resonant frequencies providing sub-nanometer vertical resolution. The tip component may be quasi-statistically calibrated and deep learning iterative image comparison and characterization may be utilized to derive mechanical properties of a sample.


Find Patent Forward Citations

Daugela, Antanas. (2022). Characterization of nanoindentation induced acoustic events (U.S. Patent No. 11346857). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11346857

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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