The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Sep. 24, 2019
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Takaaki Nagai, Kobe, JP;
Hideki Hirayama, Kobe, JP;
Hiroo Tatsutani, Kobe, JP;
Tomohiro Tsuji, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Kobe, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/574 (2006.01); G01N 15/14 (2006.01); G01N 21/64 (2006.01); G06T 7/00 (2017.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G01N 33/57426 (2013.01); G01N 15/14 (2013.01); G01N 21/6428 (2013.01); G06T 7/0012 (2013.01); G06V 20/69 (2022.01); G01N 2021/6439 (2013.01); G06T 2207/30024 (2013.01);
Abstract
Disclosed is a specimen measurement system including: a specimen measuring device that measures a specimen; a determination unit that determines whether or not the specimen is to be measured by a flow cytometer, based on a measurement result of the specimen measuring device.