The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Jul. 16, 2019
Centre National DE LA Recherche Scientifique, Paris, FR;
Ecole Supérieure DE Physique ET DE Chimie Industrielles DE LA Ville DE Paris, Paris, FR;
Alexandre Aubry, Ivry-sur-Seine, FR;
Amaury Badon, Brookline, MA (US);
Victor Barolle, Saint Cloud, FR;
Claude Boccara, Paris, FR;
Laura Cobus, Paris, FR;
Mathias Fink, Meudon, FR;
William Lambert, Paris, FR;
Abstract
In a first aspect, the present description relates to a system for non-invasively characterizing a heterogeneous medium using ultrasound, comprising at least one first array () of transducers configured to generate a series of incident ultrasound waves in a region of said heterogeneous medium and record the ultrasound waves which are backscattered by said region as a function of time, as well as a computing unit () which is coupled to said at least one first array of transducers and configured to: record an experimental reflection matrix defined between an emission basis at the input and the basis of the transducers at the output; determine, from said experimental reflection matrix, at least one first wideband reflection matrix defined in a focused base at the input and output; determine a first distortion matrix defined between said focused basis and an observation basis, said first distortion matrix resulting, directly or after a change of basis, from the term-by-term matrix product of said first wideband reflection matrix defined between said focused basis and an aberration correction basis, with the phase-conjugated matrix of a reference reflection matrix defined for a model medium, between the same bases; determine, from said first distortion matrix, at least one mapping of a physical parameter of said heterogeneous medium.