The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Aug. 16, 2019
Applicant:
Essenlix Corporation, Monmouth Junction, NJ (US);
Inventors:
Stephen Chou, Princeton, NJ (US);
Wei Ding, Princeton, NJ (US);
Wu Chou, Basking Ridge, NJ (US);
Jun Tian, Belle Mead, NJ (US);
Yuecheng Zhang, Yardley, PA (US);
Mingquan Wu, Princeton Junction, NJ (US);
Xing Li, Metuchen, NJ (US);
Assignee:
Essenlix Corporation, Monmouth Junction, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 1/00 (2006.01); G01N 15/14 (2006.01); G06N 20/00 (2019.01); G01N 1/28 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1484 (2013.01); G01N 1/2813 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); G06T 1/0014 (2013.01); G01N 2001/282 (2013.01);
Abstract
The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.
Chou, Stephen. (2022). Image-based assay using intelligent monitoring structures (U.S. Patent No. 11346764). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11346764
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile