The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Feb. 09, 2017
Applicant:

Anago Limited, Hamilton, NZ;

Inventors:

Tim Staub, Hamilton, NZ;

Peter Dowd, Hamilton, NZ;

Assignee:

Anago Limited, Hamilton, NZ;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/58 (2006.01); B23Q 17/09 (2006.01); G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
G01N 3/58 (2013.01); B23Q 17/09 (2013.01); G01N 3/08 (2013.01); G01N 2203/0032 (2013.01); G01N 2203/0676 (2013.01);
Abstract

A system for testing blade sharpness comprises a mounting arrangement for mounting a material to be cut; a force measuring device operable, in use, to determine variations in force along a blade as parts of the blade contact the material; and a control system. The control system is adapted to receive a signal that a blade sharpness test is to be performed; in response to the signal, prepare the mounting arrangement for a blade sharpness test; detect when force on the material rises above a pre-determined level; detect when the blade sharpness test is completed; and provide an indication of the force of the blade on the material.


Find Patent Forward Citations

Staub, Tim. (2022). System for testing blade sharpness (U.S. Patent No. 11346759). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11346759

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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