The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Jul. 29, 2021
Sas Institute Inc., Cary, NC (US);
Caleb Bridges King, Cary, NC (US);
Joseph Albert Morgan, Raleigh, NC (US);
Ryan Adam Lekivetz, Cary, NC (US);
Bradley Allen Jones, Cary, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
A computing system receives a request for computer-generated likelihood(s) for candidate evaluations of an industrial product set according to a measurement system analysis (MSA). The MSA comprises tests for evaluating, according to a measurement standard, the industrial product set. The request indicates a metric set representing metric(s) each quantifying an estimate of contribution to variation in evaluating the industrial product set according to the MSA. The system generates a design comprising a respective input set for each test of the MSA. The respective input set comprises setting(s) for conducting a test of the MSA. The design is designed to isolate candidate sources for contributing to the variation in evaluating the industrial product set according to the MSA. The system (e.g., prior to the MSA) outputs, based on the metric set and the design, the computer-generated likelihood(s) for the candidate evaluations of the industrial product set according to the MSA.