The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Oct. 21, 2019
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Andrew K. Thorpe, Pasadena, CA (US);

Robert O. Green, Palmdale, CA (US);

Pantazis Mouroulis, Glendora, CA (US);

David R. Thompson, Pasadena, CA (US);

Andrew D. Aubrey, Austin, TX (US);

Christian Frankenberg, Pasadena, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01N 21/31 (2006.01); G01J 3/02 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/0205 (2013.01); G01N 21/274 (2013.01); G01N 21/31 (2013.01); G01J 2003/2866 (2013.01);
Abstract

A freeform imaging system with a spectrometer and telescope components optically connected and optimized to increase the spectral and spatial resolution capabilities. Many embodiments of the system are capable of producing a spectral resolution of approximately 1 nm and a spatial resolution less than 30 m such that the imaging system can be used to accurately capture and measure point source plumes of various atmospheric gases including CH, CO, CO, NO, and HO.


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