The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Dec. 11, 2020
Applicant:

Enertia Microsystems Inc., Ann Arbor, MI (US);

Inventor:

Jae Yoong Cho, Ann Arbor, MI (US);

Assignee:

ENERTIA MICROSYSTEMS INC., Ann Arbor, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/5691 (2012.01); G01C 19/5776 (2012.01); G01C 25/00 (2006.01);
U.S. Cl.
CPC ...
G01C 19/5691 (2013.01); G01C 19/5776 (2013.01); G01C 25/00 (2013.01);
Abstract

A method of adjusting an operating parameter of a miniature electromechanical resonator comprises measuring angular coordinates of first and second principal stiffness axes of first and second wine-glass mode of the miniature electromechanical resonator, respectively; determining first and second wine-glass mode frequencies of the resonator being resonant frequencies of the first and second principal stiffness axes, respectively; calculating one or more locations on the resonator for machining to reduce a difference between the first and second wine-glass mode frequencies; and machining the one or more locations on the resonator to reduce the difference between the first and second wine-glass mode frequencies. An apparatus for adjusting an operating parameter of a miniature electromechanical resonator comprises a vibration actuator/detector configured to measure the locations of the first and second principal stiffness axes, and a micro-machining apparatus to add or remove material from the resonator for adjusting the operating parameter thereof.


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