The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Nov. 04, 2019
Applicant:

Subaru Corporation, Tokyo, JP;

Inventors:

Masahito Hayakawa, Tokyo, JP;

Iwao Murata, Tokyo, JP;

Assignee:

SUBARU CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60W 50/00 (2006.01); B60W 50/02 (2012.01); B60W 50/04 (2006.01); G07C 5/08 (2006.01);
U.S. Cl.
CPC ...
B60W 50/0205 (2013.01); B60W 50/045 (2013.01); G07C 5/0808 (2013.01); B60W 2050/0037 (2013.01);
Abstract

A failure diagnostic system includes an instrument and a failure diagnostic device. The instrument makes measurement of a measured value regarding behavior of a diagnosis target. The failure diagnostic device has a model of the diagnostic target and performs simulation based on the model. The failure diagnostic device offers a user a proposal for execution of a special operation on the diagnostic target, on the condition that a difference between a result of the simulation and the measured value is greater than a predetermined error range but the difference provides an insufficient basis to determine whether or not the diagnosis target has a failure. The result of the simulation is calculated with the model supplied with a same input as an input to the diagnosis target at the time of the measurement by the instrument of the measured value regarding the behavior of the diagnosis target.


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