The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Jun. 24, 2020
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 64/35 (2017.01); B29C 64/209 (2017.01); B29C 64/245 (2017.01); B29C 64/393 (2017.01); B29C 64/25 (2017.01); B29C 64/232 (2017.01); B33Y 50/02 (2015.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/35 (2017.08); B29C 64/209 (2017.08); B29C 64/232 (2017.08); B29C 64/245 (2017.08); B29C 64/25 (2017.08); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract
A three-dimensional shaping device includes a nozzle that discharges a shaping material from a discharge port formed on a tip end surface, a stage that includes a stacking surface on which the shaping material is stacked, a distance measurement mechanism that is disposed at a position facing the nozzle, a cleaning mechanism that cleans the tip end surface of the nozzle, and a control unit that controls the distance measurement mechanism to measure a value relating to a facing distance between the nozzle and the stacking surface after the cleaning mechanism cleans the tip end surface of the nozzle.