The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Sep. 07, 2020
Tsinghua Shenzhen International Graduate School, Guangdong, CN;
Feng Feng, Guangdong, CN;
Chao Xu, Guangdong, CN;
Xueyu Mei, Guangdong, CN;
Pingfa Feng, Guangdong, CN;
Yuan Ma, Guangdong, CN;
Tsinghua Shenzhen International Graduate School, Guangdong, CN;
Abstract
A method for monitoring chatter in a machining process includes the following steps: collecting an original signal related to chatter in the machining process; for the original signal, obtaining a signal segment for calculation and analysis by updating data points in a sliding window with a set step-length, where the step-length refers to a number of data points updated every time in the sliding window, and is not greater than the size of the sliding window; calculating fractal dimensions of the signal segments in the sliding window by using a fractal algorithm; and comparing the calculated fractal dimension with an identification threshold to determine whether chatter occurs in the machining process. The measured signal does not need to be preprocessed by using the method, which can greatly improve calculation efficiency and can ensure accuracy of chatter identification.