The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Jul. 21, 2017
Applicant:

DE Greef's Wagen-, Carrosserie-en Machinebouw B.v, Tricht, NL;

Inventor:

Wilhelm Jan Nijland, Veenendaal, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C 5/342 (2006.01);
U.S. Cl.
CPC ...
B07C 5/3422 (2013.01); B07C 5/342 (2013.01); B07C 2501/009 (2013.01);
Abstract

The invention relates to a measuring device for multispectral measuring of products, such as vegetables and fruit, a sorting system provided therewith and a method therefor. A measuring device according to the invention comprises a frame provided with transport means for transporting the products, a camera system provided with at least one light source and at least one camera for recording an image at a frequency or frequency spectrum, and a controller operatively connected to the camera system for controlling the camera system, wherein the controller is provided with a data processing system and detection system.


Find Patent Forward Citations

Nijland, Wilhelm. (2022). Measuring device for multispectral measuring of quality features or defects of products and method therefor (U.S. Patent No. 11344920). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11344920

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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