The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Sep. 14, 2020
Applicant:

Redlen Technologies, Inc., Saanichton, CA;

Inventors:

Krzysztof Iniewski, Coquitlam, CA;

Elmaddin Guliyev, Vancouver, CA;

Conny Hansson, Victoria, CA;

Assignee:

REDLEN TECHNOLOGIES, INC., Saanichton, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
A61B 6/4241 (2013.01); A61B 6/5205 (2013.01); A61B 6/585 (2013.01); G01N 23/046 (2013.01);
Abstract

Various aspects include methods for use in X-ray detectors for adjusting count measurements from pixel detectors within a pixelated detector module to correct for the effects of pileup events that occur when more than one photon is absorbed in a pixel detector during a deadtime of the detector system. In various embodiments, count measurements may be obtained at two different X-ray tube currents, from which the detector system deadtime may be calculated based on the two count measurements and a ratio of the two X-ray tube currents. Using the calculated deadtime, a pileup correction factor may be determined appropriate for the behavior of the detector system in response to pileup events. The pileup correction factor may be applied to pixel detector count values after the counts have been corrected for pixel-to-pixel differences using a flat field correction.


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