The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Jul. 06, 2017
Fujifilm Corporation, Tokyo, JP;
Atsushi Osawa, Ashigarakami-gun, JP;
Atsushi Hashimoto, Ashigarakami-gun, JP;
Kaku Irisawa, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A photoacoustic measurement probe and a probe unit capable of preventing generation of artifacts in a photoacoustic measurement apparatus are obtained. In a photoacoustic measurement probe having a light emitting unit that emits measurement light toward a subject, an acoustic wave detection element that detects an acoustic wave emitted from a portion of the subject that has received the measurement light, and a housing which has a surface facing the subject at the time of use and in which the light emitting unit and the acoustic wave detection element are housed, at least one slit that is opened to the housing surface and that extends from the housing surface toward the inside of the housing is provided between the light emitting unit and the acoustic wave detection element.