The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Jan. 25, 2021
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Fred Torok, Mercer Island, WA (US);

Michael Alan Pogue, Sunnyvale, CA (US);

Vikram Kumar Gundeti, Bellevue, WA (US);

Dharini Sundaram, Bothell, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04R 3/12 (2006.01); G06F 3/16 (2006.01); H04R 27/00 (2006.01);
U.S. Cl.
CPC ...
H04R 3/12 (2013.01); G06F 3/165 (2013.01); G06F 3/167 (2013.01); H04R 27/00 (2013.01); H04R 2227/005 (2013.01); H04R 2420/03 (2013.01); H04R 2420/07 (2013.01);
Abstract

Synchronized output of audio on a group of devices can comprise sending audio data from an audio distribution master device to one or more slave devices in the group. Scores can be assigned to respective audio playback devices, the scores being indicative of a performance level of the respective audio playback devices acting as a master device. The device with the highest score is designated as a candidate master device and one or more remaining devices are designated as a candidate slave(s). A throughput test is conducted with the highest scoring device acting as the candidate master device. The results of the throughput test are used to determine a master device for a group of devices. Latency of the throughput test can be reduced by using a prescribed time period for completion of the throughput test, and/or by selecting a first group configuration to passes the throughput test.


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