The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Oct. 31, 2013
Applicant:

Pico & Tera Co., Ltd., Suwon-si, KR;

Inventor:

Bum Je Woo, Yongin-si, KR;

Assignee:

PICO & TERA CO., LTD., Suwon-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H01L 21/677 (2006.01); F24F 7/007 (2006.01); H01L 21/673 (2006.01); F24F 7/00 (2021.01);
U.S. Cl.
CPC ...
H01L 21/67028 (2013.01); F24F 7/007 (2013.01); H01L 21/67017 (2013.01); H01L 21/67389 (2013.01); H01L 21/67393 (2013.01); H01L 21/67781 (2013.01); F24F 2007/001 (2013.01);
Abstract

Provided is an exhaust system of a wafer treatment device, and the main purpose thereof is to prevent secondary contamination of a wafer by not allowing foreign substances such as process gases and fumes and the like floating in the wafer treatment device to make contact with the wafer in a side storage. The wafer treatment device comprises: a cleaning device for removing foreign substances remaining on a wafer; and an exhaust device comprising first and second main bodies at the lower side of a main body of the wafer treatment device. By not allowing foreign substances such as process gases and fumes and the like floating in the wafer treatment device to make contact with a wafer in a side storage, secondary contamination of the wafer is prevented.


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