The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Feb. 24, 2021
Applicant:

Kioxia Corporation, Tokyo, JP;

Inventors:

Ryo Yamaki, Yokohama Kanagawa, JP;

Youyang Ng, Yokohama Kanagawa, JP;

Koji Horisaki, Yokohama Kanagawa, JP;

Kazuhisa Horiuchi, Yokohama Kanagawa, JP;

Gibeom Park, Yokohama Kanagawa, JP;

Assignee:

KIOXIA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/42 (2006.01); G11C 29/44 (2006.01); G11C 29/50 (2006.01); G11C 29/18 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G11C 29/18 (2013.01); G11C 29/44 (2013.01); G11C 29/50004 (2013.01); G11C 2029/1802 (2013.01);
Abstract

A memory system includes a non-volatile memory having a plurality of memory cells and a memory controller. The memory controller is configured to generate a histogram indicating, with respect to each of a plurality of threshold voltage levels for multi-level cell (MLC) reading, a number of memory cells at the threshold voltage level, based on data read from the plurality of memory cells using a plurality of reference read voltages, estimate a plurality of read voltages for MLC reading of the plurality of memory cells as estimation values by inputting the histogram into a read voltage estimation model, determine, through MLC reading of the plurality of memory cells using a plurality of sets of read voltages, a set of read voltages for MLC reading as observation values, and update one or more parameters of the read voltage estimation model based on the estimation values and the observation values.


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