The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Sep. 10, 2020
Applicant:

Seagate Technology Llc, Fremont, CA (US);

Inventors:

Zheng Wu, San Jose, CA (US);

Marcus Marrow, San Jose, CA (US);

Jason Bellorado, San Jose, CA (US);

Assignee:

Seagate Technology LLC, Fremont, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G11B 20/10 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G11B 20/10009 (2013.01); G06F 3/0604 (2013.01); G06F 3/0619 (2013.01); G06F 3/0656 (2013.01); G06F 3/0673 (2013.01);
Abstract

Systems and methods are disclosed for hardware-based read sample averaging in a data storage device. In one example, a read channel circuit including a buffer memory is configured to receive a read instruction to read a selected sector, obtain detected sample values for the selected sector, and determine whether the read instruction corresponds to a re-read operation for the selected sector based on determining whether there are stored samples for the selected sector already stored to a locked buffer entry of the buffer memory. When there are stored sample values stored to the locked buffer entry, the example read channel circuit determines the re-read operation is occurring, and performs read sample averaging based on the detected sample values and the stored sample values to produce averaged sample values. Other examples and configurations are also described.


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