The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
May. 03, 2019
The Governing Council of the University of Toronto, Toronto, CA;
Kiriakos Neoklis Kutulakos, Toronto, CA;
Seyed Parsa Mirdehghan, Richmond Hill, CA;
Wenzheng Chen, Toronto, CA;
THE GOVERNING COUNCIL OF THE UNIVERSITY OF TORONTO, Toronto, CA;
Abstract
There is provided a system and method for optimizing depth imaging. The method including: illuminating one or more scenes with illumination patterns; capturing one or more images of each of the scenes; reconstructing the scenes; estimating the reconstruction error and a gradient of the reconstruction error; iteratively performing until the reconstruction error reaches a predetermined error condition: determining a current set of control vectors and current set of reconstruction parameters; illuminating the one or more scenes with the illumination patterns governed by the current set of control vectors; capturing one or more images of each of the scenes while the scene is being illuminated with at least one of the illumination patterns; reconstructing the scenes from the one or more captured images using the current reconstruction parameters; and estimating an updated reconstruction error and gradient; and outputting at least one of control vectors and reconstruction parameters.