The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Oct. 31, 2019
Applicant:

Tencent America Llc, Palo Alto, CA (US);

Inventor:

Hanbo Chen, Seattle, WA (US);

Assignee:

TENCENT AMERICA LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06N 3/04 (2006.01); G06T 7/00 (2017.01); G06T 19/00 (2011.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06K 9/6267 (2013.01); G06N 3/0454 (2013.01); G06T 7/11 (2017.01); G06T 19/006 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30024 (2013.01);
Abstract

Embodiments of the present disclosure include a method, device and computer readable medium involving receiving image data to detect tissue lesions, passing the image data through at least one first convoluted neural network, segmenting the image data, fusing the segmented image data, and detecting tissue lesions.


Find Patent Forward Citations

Chen, Hanbo. (2022). Computer aided diagnosis system for detecting tissue lesion on microscopy images based on multi-resolution feature fusion (U.S. Patent No. 11341635). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11341635

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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