The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Aug. 20, 2019
Applicant:

Samsung Sds Co., Ltd., Seoul, KR;

Inventors:

Hyun Bin Loh, Seoul, KR;

Seung Jai Min, Seoul, KR;

Ki Hyo Moon, Seoul, KR;

Sung Jun Kim, Seoul, KR;

Ji Su Jeong, Seoul, KR;

Jin Hwan Han, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G06N 5/02 (2006.01); G06N 20/00 (2019.01); G06F 16/35 (2019.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01); G06N 20/00 (2019.01); G06F 16/35 (2019.01);
Abstract

A hyperparameter optimization method performed by a hyperparameter optimization apparatus to optimize hyperparameters of a model includes calculating an evaluation score for each of a plurality of hyperparameter samples constituting a first hyperparameter sample set by applying each of the hyperparameter samples to a target model, performing weighted clustering of the hyperparameter samples by using the calculated evaluation scores as weights and constructing a second hyperparameter sample set based on the clustering result.


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