The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
Jan. 14, 2019
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Roman Batoukov, Redmond, WA (US);
Richard Wydrowski, Bellevue, WA (US);
Sai Sankalp Arrabolu, Kirkland, WA (US);
Zeqiang Wang, Redmond, WA (US);
Lech Gudalewicz, Sammanish, WA (US);
Keiji Kanazawa, Seattle, WA (US);
Benjamin J. Lofton, Seattle, WA (US);
Thomas W. Potthast, Sammamish, WA (US);
Suren Aghajanyan, Bellevue, WA (US);
Khoa Tran, Redmond, WA (US);
Jian Zhang, Bellevue, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Systems and methods for data anomaly detection include recommending one or more algorithms from a set of algorithms to process received time series data, wherein the one or more algorithms are recommended based at least in part on a type of workload for processing the received time series data. Assisted parameter tuning is provided for a detected anomaly alert and calibration, and the received time series data is processed based on a user selected algorithm that is parameter tuned.