The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Jun. 06, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Kwang-Hoon Kim, Yongin-si, KR;

Do-Yun Kim, Gwacheon-si, KR;

Ki-Wook Song, Hwaseong-si, KR;

Sung-Bo Shim, Hwaseong-si, KR;

Ji-Hye Lee, Suwon-si, KR;

Dong-Chul Ihm, Suwon-si, KR;

Woo-Young Cheon, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G06F 30/367 (2020.01); H01L 21/66 (2006.01); G06F 30/398 (2020.01);
U.S. Cl.
CPC ...
G06F 30/367 (2020.01); G01N 21/9501 (2013.01); G06F 30/398 (2020.01); H01L 22/12 (2013.01);
Abstract

A method of predicting a shape of a semiconductor device includes implementing a modeled semiconductor shape with respect to a designed semiconductor layout, extracting a plurality of samples by independently linearly combining process variables with respect to the modeled semiconductor shape; generating virtual spectrums with respect to ones of the extracted plurality of samples through optical analysis, indexing the virtual spectrums to produce indexed virtual spectrums, generating a shape prediction model by using the indexed virtual spectrums as an input and the modeled semiconductor shape as an output, and indexing a spectrum measured from a manufactured semiconductor device and inputting the spectrum to the shape prediction model to predict a shape of the manufactured semiconductor device.


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