The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

May. 22, 2019
Applicant:

Adobe Inc., San Jose, CA (US);

Inventors:

Tak Yeon Lee, San Jose, CA (US);

Jonggi Hong, College Park, MD (US);

Eunyee Koh, San Jose, CA (US);

Assignee:

Adobe Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/955 (2019.01); G06N 20/00 (2019.01); G06F 9/451 (2018.01); G06F 16/93 (2019.01);
U.S. Cl.
CPC ...
G06F 16/9558 (2019.01); G06F 9/451 (2018.02); G06F 16/94 (2019.01); G06F 16/9566 (2019.01); G06N 20/00 (2019.01);
Abstract

Methods, systems, and non-transitory computer readable storage media are disclosed for determining and resolving misalignments between digital messages containing links and corresponding external digital content. For example, in one or more embodiments, the disclosed systems extract a plurality of alignment classification features from a digital link in a digital message and corresponding external digital content. Based on the alignment classification features and using a machine learning classification model, the disclosed system can generate alignment probability scores for a plurality of misalignment classes. The disclosed system can report identified misalignments of corresponding misalignment classes in a misalignment identification user interface. Furthermore, the disclosed system can receive publisher input via the misalignment identification user interface to further personalize the machine learning classification model.


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