The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Jan. 11, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Emrah Acar, Montvale, NJ (US);

Gradus Janssen, Putnam Valley, NY (US);

Rajiv V. Joshi, Yorktown Heights, NY (US);

Tong Li, Austin, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 11/07 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G05B 19/41875 (2013.01); G06N 20/00 (2019.01); G05B 2219/32077 (2013.01);
Abstract

A computer-implemented method and computing system are provided for failure prediction of a batch of manufactured objects. The method includes classifying, by a processor sing a simulation, a set of samples with uniformly distributed parameter values, to generate sample classifications for the batch of manufactured objects. The method further includes determining, by the processor, a centroid of failing ones of the samples in the set, based on the sample classifications. The method also includes generating, by the processor, a new set of samples with a distribution around the centroid of the failing ones of the sample in the set. The method additionally includes populating, by the processor, a nearest neighbor vector space using the new set of samples. The method further includes classifying, by the processor, the new set of samples by performing a nearest neighbor search on the nearest neighbor vector space using a distance metric.


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