The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
Jun. 26, 2020
Applicant:
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Inventors:
Tipper Truong, San Jose, CA (US);
Joseph Brandt, Salt Lake City, UT (US);
Philip Shilane, Newtown, PA (US);
Assignee:
EMC IP Holding Company LLC, Hopkinton, MA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0604 (2013.01); G06F 3/0638 (2013.01); G06F 3/0673 (2013.01);
Abstract
Described is a system for detecting corruption in a deduplicated object storage system accessible by one or more microservices while minimizing costly read operations on objects. A controller module and one or more worker nodes execute verification paths in concert with each other to identify object corruptions. The controller module estimates a number of worker nodes required for execution of different types of verification paths.