The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Mar. 03, 2020
Applicant:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Inventors:

Kevin Chao, Mountain View, CA (US);

Pradeep Kaushik, Sunnyvale, CA (US);

Richard W. Sze, Saratoga, CA (US);

John A. Genovesi, Austin, TX (US);

Assignee:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06F 16/10 (2019.01); G06F 16/907 (2019.01); G05B 19/406 (2006.01); G05B 19/408 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41835 (2013.01); G05B 19/406 (2013.01); G05B 19/408 (2013.01); G05B 19/4185 (2013.01); G05B 19/41885 (2013.01); G06F 16/10 (2019.01); G06F 16/907 (2019.01); G05B 2219/31326 (2013.01); G05B 2219/31348 (2013.01); G05B 2219/32403 (2013.01); G05B 2219/34334 (2013.01); G05B 2219/35001 (2013.01); G05B 2219/35011 (2013.01);
Abstract

A scalable industrial data ingestion and analysis architecture integrates and collects data from multiple diverse sources at one or more industrial facilities. Data sources can include plant-level industrial devices and higher-level business systems. The data can be integrated and collected from multiple sources at an on-premise edge or gateway device, which sends the data to event queues on the cloud platform. The data queues orchestrate and store the data on cloud storage, and an analytics layer performs business analytics or other types of analysis on the stored data to produce various outcomes. Similar analytic platforms can also be implemented at the device level, and analytic functions can be scaled between the device level and higher levels in accordance with the scope of a given analytic function.


Find Patent Forward Citations

Loading…