The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Apr. 12, 2019
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Christian Hofmann, Erlangen, DE;

André Ritter, Neunkirchen am Brand, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 7/00 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01T 7/005 (2013.01); A61B 6/583 (2013.01);
Abstract

A method for providing an item of conversion information describing an allocation rule of at least one physical property value of a material in a voxel relating to an image value of the voxel in a three-dimensional image dataset recorded with an X-ray apparatus is provided. By scanning a phantom including at least one calibration material in the X-ray apparatus, a calibration database that is used for determining the allocation rule is determined. The image dataset is recorded with a receiving spectrum geared to an X-ray detector of the X-ray apparatus. The receiving spectrum is described by at least one spectral parameter. For determining the allocation rule dependent upon the spectral parameter, calibration data derived from the measured calibration dataset describing different receiving spectra is used.


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