The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Apr. 24, 2018
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Christoph Herrmann, Aachen, DE;

Roger Steadman Booker, Aachen, DE;

Jakob Wijnand Mulder, Eindhoven, NL;

Matthias Simon, Aachen, DE;

Jacques Jules Van Oekel, Veldhoven, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2018 (2013.01); A61B 6/032 (2013.01);
Abstract

A detector includes a first detection layer () and a second detector layer (). The first and second detection layers include a first and second scintillator () (), a first and second active photosensing region () (), a first portion () of a first substrate (), and a second portion () of a second substrate (). An imaging system () includes a radiation source (), a radiation sensitive detector array () comprising a plurality of multi-layer detectors (), and a reconstructor () configured to reconstruct an output of the detector array and produces an image. The detector array includes a first detection layer and a second detector layer with a first and second scintillator, a first and second active photosensing region, a first portion of a first substrate, and a second portion of a second substrate.


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