The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
Mar. 23, 2018
Dolphin Measurement System, Llc, Providence, RI (US);
Ellis S. Waldman, Providence, RI (US);
Alexander M. Raykhman, Providence, RI (US);
Boris Sherman, Providence, RI (US);
Ellis S. Waldman, Providence, RI (US);
Alexander M. Raykhman, Providence, RI (US);
Boris Sherman, Providence, RI (US);
DOLPHIN MEASUREMENT SYSTEMS, LLC, Providence, RI (US);
Abstract
An apparatus and associated methods for measuring thickness and velocity of flat moving materials utilizing high frequency radar technologies. Two identical radar-based systems for measuring absolute distances between the source of the radar-generated electromagnetic wave and each surface of a flat sheet material is used to determine the thickness of that material as a relative distance. A pair of high frequency radars situated at different locations used to measure the delay time between the occurrences of fingerprint-like unevenness on the moving flat sheet of material to determine the linear velocity of the moving material sheet.