The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Nov. 07, 2018
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Toshiyuki Isa, Kanagawa, JP;

Akihiro Chida, Kanagawa, JP;

Ryota Tajima, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/392 (2019.01); G01R 31/36 (2020.01); G01R 31/367 (2019.01); G01R 31/374 (2019.01);
U.S. Cl.
CPC ...
G01R 31/392 (2019.01); G01R 31/367 (2019.01); G01R 31/3648 (2013.01); G01R 31/374 (2019.01);
Abstract

An object is to predict a deterioration state of a secondary battery even in an environment where temperature and a charging voltage change. A lifetime estimation device of the secondary battery includes a measuring unit for measuring the capacity of the secondary battery in the full charging state; a temperature sensing unit for sensing the ambient temperature of the secondary battery; and a storage unit for storing a table of a proportional coefficient corresponding to temperature in advance, and a predicted deterioration line of the secondary battery is calculated with the use of a nonlinear regression equation approximated to a measured deterioration line obtained by the measuring unit. The lifetime estimation device may construct a lifetime estimation system with the use of a neural network.


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