The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Sep. 30, 2020
Applicant:

Analog Devices, Inc., Norwood, MA (US);

Inventors:

Amit Kumar Singh, Woburn, MA (US);

Christopher C. McQuilkin, Hollis, NH (US);

Brian Carey, Stow, MA (US);

Assignee:

Analog Devices, Inc., Norwood, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/319 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31905 (2013.01); G01R 31/2891 (2013.01); G01R 31/31702 (2013.01);
Abstract

A force-sense system for providing signals to, or receiving signals from, a device under test (DUT) at a first DUT node. The system can include an interface coupling first and second portions of a first force-sense measurement device, such as a parametric measurement unit. The first and second portions of the first force-sense measurement device can be provided using respective different integrated circuits, such as can comprise different semiconductor dies of different die types. In a first test mode, the interface can be configured to communicate a first DUT force signal from the first portion to the second portion of the first force-sense measurement device, and in a second test mode the interface can be configured to communicate DUT sense information, received from the DUT at the first DUT node, from the second portion to the first portion of the first force-sense measurement device.


Find Patent Forward Citations

Singh, Amit. (2022). Partitioned force-sense system for test equipment (U.S. Patent No. 11340295). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11340295

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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