The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
Jan. 15, 2018
Global Inspections Ndt, Inc., Kelowna, CA;
Thomas Shumka, Kelowna, CA;
Jason Shumka, Kelowna, CA;
Abstract
A form-fitting eddy current array probe for inspecting helical gears is provided, the probe comprising: a leg which includes a sensor zone with a plurality of eddy current arrays; an arm attached to and normal with the leg to provide an L-shaped probe, the arm including a sensor zone with a plurality of eddy current arrays; a resilient layer underlying the sensor zones; a gel layer attached to an upper surface of the sensor zones, the gel layer including a fluid gel and an outer covering encasing the fluid gel; and an encoder distally located on the leg. A method of inspecting a girth gear set including a helical gear and a girth gear using the form-fitting eddy current array probe is also provided.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile