The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Jan. 20, 2020
Applicants:

Nuctech Company Limited, Beijing, CN;

Tsinghua University, Beijing, CN;

Inventors:

Zhiqiang Chen, Beijing, CN;

Li Zhang, Beijing, CN;

Zhenhua Zhao, Beijing, CN;

Yunda Sun, Beijing, CN;

Xin Jin, Beijing, CN;

Wuyang Liang, Beijing, CN;

Assignees:

Nuctech Company Limited, Beijing, CN;

Tsinghua University, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01D 18/00 (2006.01); G01N 23/046 (2018.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01); G01V 5/00 (2006.01); G01V 13/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); A61B 6/032 (2013.01); A61B 6/585 (2013.01); G01V 5/005 (2013.01); G01V 13/00 (2013.01);
Abstract

Disclosed are calibration assembly and calibration method of calibrating geometric parameters of a CT apparatus. The calibration assembly includes at least one calibration unit each including a plurality of calibration wires, and the plurality of calibration wires are arranged regularly in a same plane. The calibration assembly is easy to be processed and can be used to calibrate geometric parameters of a CT apparatus, and the calibration operations are simple and easy to be implemented.


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