The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Aug. 13, 2019
Applicant:

Chiron-werke Gmbh & Co. KG, Tuttlingen, DE;

Inventors:

Pascal Schroeder, Muehlheim an der Donau, DE;

Claus Eppler, Messstetten, DE;

Assignee:

CHIRON-WERKE GmbH & Co. KG, Tuttlingen, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 13/00 (2019.01); G05B 19/4065 (2006.01); G05B 19/401 (2006.01); G05B 19/404 (2006.01); B23Q 17/09 (2006.01);
U.S. Cl.
CPC ...
G01M 13/00 (2013.01); B23Q 17/0952 (2013.01); G05B 19/401 (2013.01); G05B 19/404 (2013.01); G05B 19/4065 (2013.01); G05B 2219/37256 (2013.01);
Abstract

A method of controlling a machine tool comprising the steps of: providing a data memory containing, for at least one specific working axis of the plurality of working axes, a plurality of data tuples each assigning a load value to a position value relative to the specific working axis, selecting a first data tuple and a second data tuple whose load values are different, and generating at least one control command for the machine tool, wherein the control command is adapted to perform a first tolerance measurement at a first position value and a second tolerance measurement at a second position value, and wherein, based on a first result of the first tolerance measurement and a second result of the second tolerance measurement, information about wear of a part of the machine tool is output. A corresponding device is also be disclosed.


Find Patent Forward Citations

Schroeder, Pascal. (2022). Method and apparatus for wear analysis on a machine tool (U.S. Patent No. 11340139). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11340139

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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