The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
Feb. 18, 2021
Applicant:
Trioptics Gmbh, Wedel, DE;
Inventors:
Eugen Dumitrescu, Wedel, DE;
Patrik Langehanenberg, Wedel, DE;
Iris Erichsen, Hetlingen, DE;
Alexander Bai, Bremen, DE;
Simon Zilian, Hamburg, DE;
Aiko Ruprecht, Hamburg, DE;
Assignee:
Trioptics GmbH, Wedel, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01); G02B 7/04 (2021.01); G02B 13/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0292 (2013.01); G01M 11/0207 (2013.01); G02B 7/04 (2013.01); G02B 13/001 (2013.01);
Abstract
The invention relates to an apparatus () for detecting imaging quality of an optical system () with at least one lens () or lens group. The apparatus () includes an MTF measuring apparatus () for measuring a modulation transfer function at a plurality of field points in the field of view of the optical system (), and a centering measuring apparatus () for measuring a centered state of the optical system ().