The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
Apr. 20, 2021
Applicants:
Tsinghua University, Beijing, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Inventors:
Jun Zhu, Beijing, CN;
Ben-Qi Zhang, Beijing, CN;
Yi-Lin Tan, Beijing, CN;
Guo-Fan Jin, Beijing, CN;
Shou-Shan Fan, Beijing, CN;
Assignees:
Tsinghua University, Beijing, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/18 (2006.01); G01J 3/28 (2006.01); G01J 3/04 (2006.01);
U.S. Cl.
CPC ...
G01J 3/18 (2013.01); G01J 3/04 (2013.01); G01J 3/2803 (2013.01); G01J 3/2823 (2013.01);
Abstract
A freeform concave grating imaging spectrometer includes a slit, a freeform concave grating, and an image surface. The lights incident from the slit is irradiated on the freeform concave grating to be dispersed and reflected, to form a reflected light beam. The reflected light beam is irradiated on the image surface, so that the lights of different wavelengths incident from the slit are separated and imaged on the image surface.