The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Jun. 29, 2020
Applicant:

Faro Technologies, Inc., Lake Mary, FL (US);

Inventors:

Julian Becker, Korntal-Münchingen, DE;

Daniel Pompe, Leonberg, DE;

Assignee:

FARO TECHNOLOGIES, INC., Lake Mary, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 9/02015 (2022.01); G01B 9/0209 (2022.01); G01B 9/02 (2022.01);
U.S. Cl.
CPC ...
G01B 11/002 (2013.01); G01B 9/0209 (2013.01); G01B 9/02015 (2013.01); G01B 9/02041 (2013.01);
Abstract

According to one embodiment, a three-dimensional (3D) measuring device is provided. The 3D measuring device includes a processor system that is configured to generate a point cloud representing multiple surfaces. The point cloud includes multiple scan points. Generating the point cloud includes receiving spherical coordinates for a scan point, the spherical coordinates comprising a distance (r), a polar angle (θ), and an azimuth angle (φ). Generating the point cloud further includes homogenizing a scan point density of the surfaces by filtering the scan points. The homogenizing includes computing a value (p) for the scan point based on the spherical coordinates. Based on the value exceeding a predetermined threshold, storing the scan point as part of the point cloud, and based on the value not exceeding the predetermined threshold, discarding the scan point.


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