The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
Jun. 21, 2019
Northwestern University, Evanston, IL (US);
Uchicago Argonne, Llc, Chicago, IL (US);
The University of Chicago, Chicago, IL (US);
Kuan He, Cupertino, CA (US);
Oliver Strider Cossairt, Evanston, IL (US);
Aggelos K. Katsaggelos, Chicago, IL (US);
Norbert Scherer, Chicago, IL (US);
Mark Hereld, Chicago, IL (US);
Northwestern University, Evanston, IL (US);
UChicago Argonne, LLC, Chicago, IL (US);
The University of Chicago, Chicago, IL (US);
Abstract
A system to generate image representations includes a first objective that receives a first light beam emitted from a sample and a second objective that receives a second light beam emitted from the sample, where the first light beam and the second light beam have conjugate phase. The system also includes a first diffractive element to receive the first light beam and separate it into a first plurality of diffractive light beams that are spatially distinct, and a second diffractive element to receive the second light beam and separate it into a second plurality of diffractive light beams that are spatially distinct. The system further includes a detector that receives the first and second plurality of diffractive light beams. The first plurality of diffractive light beams and the second plurality of diffractive light beams are simultaneously directed and focused onto different portions of an image plane of the detector.