The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Mar. 30, 2018
Applicant:

Nanjing Institute of Astronomical Optics & Technology, National Astornomical Observatories, Chinese Academy of Sciences, Jiangsu, CN;

Inventors:

Jinfeng Wang, Jiangsu, CN;

Meng Huang, Jiangsu, CN;

Jie Tian, Jiangsu, CN;

Yeru Wang, Jiangsu, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 14/35 (2006.01); C23C 14/02 (2006.01); C23C 14/14 (2006.01); G02B 1/10 (2015.01);
U.S. Cl.
CPC ...
C23C 14/35 (2013.01); C23C 14/028 (2013.01); C23C 14/14 (2013.01); G02B 1/10 (2013.01);
Abstract

A magnetron sputtering scanning method for manufacturing a silicon carbide optical reflector surface modification layer and improving surface profile includes (1) for a silicon carbide plane mirror to be modified, first utilizing diamond micro-powders to grind and roughly polish an aspherical silicon carbide reflector with a conventional polishing or CCOS numerical control machining method; (2) after the surface profile precision of the silicon carbide reflector satisfies a modification requirement, utilizing a strip-shaped magnetron sputtering source to deposit a compact silicon modification layer on the surface of the silicon carbide reflector; (3) then, utilizing a circular sputtering source to modify and improve the surface profile of the reflector; and (4) finally, finely polishing the modification layer, and achieving the requirements for machining the surface profile and roughness of the reflector.


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